Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Reconfigurable scan network defect diagnosis

Reconfigurable scan network defect diagnosis

US Patent 10520550 · Granted Dec 31, 2019

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Memory built-in self-test with address skipping trim search2025
Memory built-in self-test with automated reference trim feedback for memory sens2024
Memory built-in self-test with automated multiple step reference trimming2024
Test access architecture for stacked memory and logic dies2017
Test access architecture for multi-die circuits2016
Test access architecture for stacked dies2016
Fault dictionaries for integrated circuit yield and quality analysis methods and2011
Determining and analyzing integrated circuit yield and quality2009
Device for and method of examining the signal performance of semiconductor circu2007
Method, system and program product for testing and/or diagnosing circuits using 2005
Method and apparatus for monitoring a selected group of fuel cells of a high-tem2002
Method for operating a PEM fuel cell plant and PEM fuel cell plant2001