Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Methods and apparatus for absolute and relative depth measurements using camera focus distance

Methods and apparatus for absolute and relative depth measurements using camera focus distance

US Patent 10498948 · Granted Dec 3, 2019

Estimated economic value: $22,017,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Methods and apparatus for measuring temperature using centerfind systems2025
Modular mainframe layout for supporting multiple semiconductor process modules o2025
Methods and systems for temperature control for a substrate2025
Servo-control system2025
Methods and systems of optical inspection of electronic device manufacturing mac2025
Integrated substrate measurement system2024
Integrated substrate measurement system2024
Integrated substrate measurement system2024
Disturbance compensation for substrate processing recipes2024
Methods and systems for temperature control for a substrate2024
Modular mainframe layout for supporting multiple semiconductor process modules o2024
Modular mainframe layout for supporting multiple semiconductor process modules o2024