Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Wave interface assembly for automatic test equipment for semiconductor testing

Wave interface assembly for automatic test equipment for semiconductor testing

US Patent 10393772 · Granted Aug 27, 2019

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Apparatus, method and computer readable storage medium for preventing rolling of2024
Braking control system and method of vehicle2024
High density waveguide assembly for millimeter and 5G applications2022
Plating methods for modular and/or ganged waveguides for automatic test equipmen2021
Plating methods for modular and/or ganged waveguides for automatic test equipmen2021
Plating methods for modular and/or ganged waveguides for automatic test equipmen2021
Plating methods for modular and/or ganged waveguides for automatic test equipmen2021
Frequency modulated (FM) chirp testing for automotive radars using standard auto2020
Automated power-in-the-bucket measurement apparatus for large aperture laser sys2019
Frequency modulated (FM) chirp testing for automotive radars using standard auto2019
Multiple waveguide structure with single flange for automatic test equipment for2019
Multiple waveguide structure with single flange for automatic test equipment for2019