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Plating methods for modular and/or ganged waveguides for automatic test equipment for semiconductor testing |
Don Lee, Daniel Lam, Kosuke Miyao |
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Frequency modulated (FM) chirp testing for automotive radars using standard automated test equipment (ATE) digital pin channels |
Robert Bartlett |
2020-05-26 |
| 10401476 |
Frequency modulated (FM) chirp testing for automotive radars using standard automated test equipment (ATE) digital pin channels |
Robert Bartlett |
2019-09-03 |
| 10393772 |
Wave interface assembly for automatic test equipment for semiconductor testing |
Don Lee, Daniel Lam, Kosuke Miyao |
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| 10381707 |
Multiple waveguide structure with single flange for automatic test equipment for semiconductor testing |
Don Lee, Daniel Lam, Kosuke Miyao |
2019-08-13 |
| 10371741 |
Characterization of phase shifter circuitry in integrated circuits (ICs) using standard automated test equipment (ATE) |
— |
2019-08-06 |
| 10114067 |
Integrated waveguide structure and socket structure for millimeter waveband testing |
Daniel Lam, Don Lee, Kosuke Miyao |
2018-10-30 |