| 10944148 |
Plating methods for modular and/or ganged waveguides for automatic test equipment for semiconductor testing |
Don Lee, Roger McAleenan, Kosuke Miyao |
2021-03-09 |
| 10520360 |
Automated power-in-the-bucket measurement apparatus for large aperture laser systems |
Michael L. Dupuis, Daniel K. Smith, Christopher J. Lieto, Michael E. Farey, Joshua E. Rothenberg |
2019-12-31 |
| 10393772 |
Wave interface assembly for automatic test equipment for semiconductor testing |
Don Lee, Roger McAleenan, Kosuke Miyao |
2019-08-27 |
| 10381707 |
Multiple waveguide structure with single flange for automatic test equipment for semiconductor testing |
Don Lee, Roger McAleenan, Kosuke Miyao |
2019-08-13 |
| 10371716 |
Method and apparatus for socket power calibration with flexible printed circuit board |
Donald M. Lee |
2019-08-06 |
| 10114067 |
Integrated waveguide structure and socket structure for millimeter waveband testing |
Don Lee, Roger McAleenan, Kosuke Miyao |
2018-10-30 |
| 9921244 |
Production-level modularized load board produced using a general universal device interface for automatic test equipment for semiconductor testing |
— |
2018-03-20 |
| 9921266 |
General universal device interface for automatic test equipment for semiconductor testing |
— |
2018-03-20 |
| 9838076 |
Handler with integrated receiver and signal path interface to tester |
— |
2017-12-05 |
| 7053640 |
System and method for providing high RF signal isolation and low common ground inductance in an RF circuit testing environment |
David A. Feld, Paul Bradley |
2006-05-30 |