Daniel Lam — 10 Patents at Advantest

Daniel Lam has been granted 10 US patents while listed as an inventor at Advantest. The first was granted in 2006 and the most recent in March 2021. Daniel Lam ranks #481,000 of 4,157,543 US inventors in our database (top 11.6%). Patent records list Daniel Lam in San Jose, CA, US.

Issued Patents All Time

Showing 1–10 of 10 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
10944148	Plating methods for modular and/or ganged waveguides for automatic test equipment for semiconductor testing	Don Lee, Roger McAleenan, Kosuke Miyao	2021-03-09
10520360	Automated power-in-the-bucket measurement apparatus for large aperture laser systems	Michael L. Dupuis, Daniel K. Smith, Christopher J. Lieto, Michael E. Farey, Joshua E. Rothenberg	2019-12-31	$97,332,000
10393772	Wave interface assembly for automatic test equipment for semiconductor testing	Don Lee, Roger McAleenan, Kosuke Miyao	2019-08-27
10381707	Multiple waveguide structure with single flange for automatic test equipment for semiconductor testing	Don Lee, Roger McAleenan, Kosuke Miyao	2019-08-13
10371716	Method and apparatus for socket power calibration with flexible printed circuit board	Donald M. Lee	2019-08-06
10114067	Integrated waveguide structure and socket structure for millimeter waveband testing	Don Lee, Roger McAleenan, Kosuke Miyao	2018-10-30
9921244	Production-level modularized load board produced using a general universal device interface for automatic test equipment for semiconductor testing	—	2018-03-20
9921266	General universal device interface for automatic test equipment for semiconductor testing	—	2018-03-20
9838076	Handler with integrated receiver and signal path interface to tester	—	2017-12-05
7053640	System and method for providing high RF signal isolation and low common ground inductance in an RF circuit testing environment	David A. Feld, Paul Bradley	2006-05-30	$5,305,000

Daniel Lam — 10 Patents

Issued Patents All Time

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