Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10944148 | Plating methods for modular and/or ganged waveguides for automatic test equipment for semiconductor testing | Don Lee, Roger McAleenan, Kosuke Miyao | 2021-03-09 |
| 10520360 | Automated power-in-the-bucket measurement apparatus for large aperture laser systems | Michael L. Dupuis, Daniel K. Smith, Christopher J. Lieto, Michael E. Farey, Joshua E. Rothenberg | 2019-12-31 |
| 10393772 | Wave interface assembly for automatic test equipment for semiconductor testing | Don Lee, Roger McAleenan, Kosuke Miyao | 2019-08-27 |
| 10381707 | Multiple waveguide structure with single flange for automatic test equipment for semiconductor testing | Don Lee, Roger McAleenan, Kosuke Miyao | 2019-08-13 |
| 10371716 | Method and apparatus for socket power calibration with flexible printed circuit board | Donald M. Lee | 2019-08-06 |
| 10114067 | Integrated waveguide structure and socket structure for millimeter waveband testing | Don Lee, Roger McAleenan, Kosuke Miyao | 2018-10-30 |
| 9921244 | Production-level modularized load board produced using a general universal device interface for automatic test equipment for semiconductor testing | — | 2018-03-20 |
| 9921266 | General universal device interface for automatic test equipment for semiconductor testing | — | 2018-03-20 |
| 9838076 | Handler with integrated receiver and signal path interface to tester | — | 2017-12-05 |
| 7053640 | System and method for providing high RF signal isolation and low common ground inductance in an RF circuit testing environment | David A. Feld, Paul Bradley | 2006-05-30 |