KM

Kosuke Miyao

AD Advantest: 5 patents #198 of 1,193Top 20%
Overall (All Time): #962,365 of 4,157,543Top 25%
5
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
10944148 Plating methods for modular and/or ganged waveguides for automatic test equipment for semiconductor testing Don Lee, Daniel Lam, Roger McAleenan 2021-03-09
10393772 Wave interface assembly for automatic test equipment for semiconductor testing Don Lee, Daniel Lam, Roger McAleenan 2019-08-27
10381707 Multiple waveguide structure with single flange for automatic test equipment for semiconductor testing Don Lee, Daniel Lam, Roger McAleenan 2019-08-13
10114067 Integrated waveguide structure and socket structure for millimeter waveband testing Daniel Lam, Don Lee, Roger McAleenan 2018-10-30
9647632 Lumped element radio frequency tuning calibration process Donald M. Lee, Heidi Barnes, Bela Szendrenyi, Vanessa Bischler 2017-05-09