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Plating methods for modular and/or ganged waveguides for automatic test equipment for semiconductor testing |
Don Lee, Daniel Lam, Roger McAleenan |
2021-03-09 |
| 10393772 |
Wave interface assembly for automatic test equipment for semiconductor testing |
Don Lee, Daniel Lam, Roger McAleenan |
2019-08-27 |
| 10381707 |
Multiple waveguide structure with single flange for automatic test equipment for semiconductor testing |
Don Lee, Daniel Lam, Roger McAleenan |
2019-08-13 |
| 10114067 |
Integrated waveguide structure and socket structure for millimeter waveband testing |
Daniel Lam, Don Lee, Roger McAleenan |
2018-10-30 |
| 9647632 |
Lumped element radio frequency tuning calibration process |
Donald M. Lee, Heidi Barnes, Bela Szendrenyi, Vanessa Bischler |
2017-05-09 |