Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method to analyze spectroscopic ellipsometry or intensity data of porous samples utilizing the anisotropic bruggeman-effective medium theory

Method to analyze spectroscopic ellipsometry or intensity data of porous samples utilizing the anisotropic bruggeman-effective medium theory

US Patent 10175160 · Granted Jan 8, 2019

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Fast and accurate Mueller matrix infrared ellipsometer2023
Fast and accurate Mueller matrix infrared ellipsometer2023
Fast and accurate mueller matrix infrared spectroscopic ellipsometer2023
Fast and accurate mueller matrix infrared spectroscopic ellipsometer2023
Reflectometer, spectrophotometer, ellipsometer and polarimeter system with a sup2023
Reflectometer, spectrophotometer, ellipsometer and polarimeter system with a sup2023
Reflectometer, spectrophotometer, ellipsometer and polarimeter system with a sup2023
Reflectometer, spectrophotometer, ellipsometer and polarimeter system with a sup2023
Snapshot ellipsometer2022
Reflectometer, spectrophotometer, ellipsometer and polarimeter system with a sup2021
Beam focusing and reflective optics2021
Beam focusing and reflective optics2021