Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method for localizing defects on substrates

Method for localizing defects on substrates

US Patent 10108085 · Granted Oct 23, 2018

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Apparatus and method for manipulating a focus of excitation light on or in a sam2025
Method and device for determining the optimal position of the focal plane for ex2025
Method and device for evaluating a statistically distributed measured value in t2025
Method and device for evaluating a statistically distributed measured value in t2025
Method and apparatus for evaluating an unknown effect of defects of an element o2024
Method and apparatus for evaluating an unknown effect of defects of an element o2024
Apparatus and method for analyzing an element of a photolithography process with2024
Apparatus and method for analyzing an element of a photolithography process with2024
Actuator for motor vehicle applications2024
Autofocusing method for an imaging device2024
Method for detecting an object structure and apparatus for carrying out the meth2024
Method for detecting an object structure and apparatus for carrying out the meth2024