Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| RE39783 | Chemical mechanical planarization (CMP) slurry quality control process and particle size distribution measuring systems | Todd A. Cerni, Dennis J. Knowlton | 2007-08-21 |
| 7235214 | System and method for measuring molecular analytes in a measurement fluid | Daniel Rodier, Dale Griffin | 2007-06-26 |
| 7208123 | Molecular contamination monitoring system and method | Brian A. KNOLLENBERG, Daniel Rodier | 2007-04-24 |
| 6275290 | Chemical mechanical planarization (CMP) slurry quality control process and particle size distribution measuring systems | Todd A. Cerni, Dennis J. Knowlton | 2001-08-14 |
| 6246474 | Method and apparatus for measurement of particle size distribution in substantially opaque slurries | Todd A. Cerni | 2001-06-12 |