Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| RE39783 | Chemical mechanical planarization (CMP) slurry quality control process and particle size distribution measuring systems | Todd A. Cerni, Scott Waisanen | 2007-08-21 |
| 6275290 | Chemical mechanical planarization (CMP) slurry quality control process and particle size distribution measuring systems | Todd A. Cerni, Scott Waisanen | 2001-08-14 |
| 5861950 | Particle detection system utilizing an inviscid flow-producing nozzle | — | 1999-01-19 |
| 5805281 | Noise reduction utilizing signal multiplication | Edward Ray Green | 1998-09-08 |
| 5671046 | Device and method for optically detecting particles in a free liquid stream | — | 1997-09-23 |