DR

Daniel Rodier

PS Particle Measuring Systems: 15 patents #2 of 64Top 4%
Overall (All Time): #307,199 of 4,157,543Top 8%
15
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12399114 Modular particle counter with docking station Brian A. KNOLLENBERG, Edward D. Yates 2025-08-26
12276592 Particle detection via scattered light combined with incident light 2025-04-15
11988593 Advanced systems and methods for interferometric particle detection and detection of particles having small size dimensions Timothy A. Ellis, Chris BONINO, Brian A. KNOLLENBERG, James LUMPKIN, Dwight A. Sehler +2 more 2024-05-21
11946852 Particle detection systems and methods for on-axis particle detection and/or differential detection James LUMPKIN, Dwight A. Sehler, Brian A. KNOLLENBERG 2024-04-02
11428617 Slurry monitor coupling bulk size distribution and single particle detection Brian A. KNOLLENBERG 2022-08-30
11428619 Detecting nanoparticles on production equipment and surfaces Brian A. KNOLLENBERG 2022-08-30
11268930 Triggered sampling systems and methods Brian A. KNOLLENBERG, Isidro Sanchez 2022-03-08
11237095 Particle detection systems and methods for on-axis particle detection and/or differential detection James LUMPKIN, Dwight A. Sehler, Brian A. KNOLLENBERG 2022-02-01
10928293 Detecting nanoparticles on production equipment and surfaces Brian A. KNOLLENBERG 2021-02-23
10908059 Slurry monitor coupling bulk size distribution and single particle detection Brian A. KNOLLENBERG 2021-02-02
9808760 Active filtration system for controlling cleanroom environments Gerald Gromala, Ronald W. Adkins, Gilberto Dalmaso, Brian A. KNOLLENBERG 2017-11-07
9682345 Method of treating a cleanroom enclosure Gerald Gromala, Ronald W. Adkins, Gilberto Dalmaso, Brian A. KNOLLENBERG 2017-06-20
7235214 System and method for measuring molecular analytes in a measurement fluid Scott Waisanen, Dale Griffin 2007-06-26
7208123 Molecular contamination monitoring system and method Brian A. KNOLLENBERG, Scott Waisanen 2007-04-24
6945090 Method and apparatus for monitoring molecular contamination of critical surfaces using coated SAWS 2005-09-20