DS

Dwight A. Sehler

PS Particle Measuring Systems: 12 patents #3 of 64Top 5%
Overall (All Time): #397,793 of 4,157,543Top 10%
12
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12326393 Enhanced dual-pass and multi-pass particle detection Mehran Vahdani MOGHADDAM, Brian A. KNOLLENBERG 2025-06-10
11988593 Advanced systems and methods for interferometric particle detection and detection of particles having small size dimensions Timothy A. Ellis, Chris BONINO, Brian A. KNOLLENBERG, James LUMPKIN, Daniel Rodier +2 more 2024-05-21
11946852 Particle detection systems and methods for on-axis particle detection and/or differential detection Daniel Rodier, James LUMPKIN, Brian A. KNOLLENBERG 2024-04-02
11237095 Particle detection systems and methods for on-axis particle detection and/or differential detection Daniel Rodier, James LUMPKIN, Brian A. KNOLLENBERG 2022-02-01
8427642 Two-dimensional optical imaging methods and systems for particle detection John R. Mitchell, Jon C. Sandberg, Michael Williamson, David Rice 2013-04-23
8174697 Non-orthogonal particle detection systems and methods John R. Mitchell, Jon C. Sandberg 2012-05-08
8154724 Two-dimensional optical imaging methods and systems for particle detection John R. Mitchell, Michael Williamson, David Rice, Jon C. Sandberg 2012-04-10
8027035 Non-orthogonal particle detection systems and methods John R. Mitchell, Jon C. Sandberg 2011-09-27
7916293 Non-orthogonal particle detection systems and methods John R. Mitchell, Jon C. Sandberg 2011-03-29
7456960 Particle counter with improved image sensor array Todd A. Cerni 2008-11-25
7030980 Diode pumped intracavity laser particle counter with improved reliability and reduced noise Todd A. Cerni 2006-04-18
6903818 Low noise intracavity laser particle counter Todd A. Cerni, Mark Lilly 2005-06-07