Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
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Gil Balog — 15 Patents

OPOptimaltest: 11 patents #1 of 6Top 20%
OPOptimal Plus: 4 patents #6 of 18Top 35%
Jerusalem, IL: #102 of 2,585 inventorsTop 4%
Overall (All Time): #307,048 of 4,157,543Top 8%
15 Patents All Time
Gil Balog has been granted 15 US patents while listed as an inventor at Optimaltest. The first was granted in 2008 and the most recent in November 2018. Gil Balog ranks #307,048 of 4,157,543 US inventors in our database (top 7.4%). Patent records list Gil Balog in Jerusalem, IL.

Patents per Year

Patents granted per year, 2008 to 2018Bar chart with a peak of 3 patents in 2009.peak 32008: 1 patents20082009: 3 patents20092010: 3 patents20102011: 2 patents20112012: 1 patents20122013: 1 patents20132014: 2 patents20142016: 1 patents20162018: 1 patents2018

Issued Patents All Time

Showing 1–15 of 15 patents

Patent #TitleCo-InventorsDate
10118200 System and method for binning at final test Reed Linde 2018-11-06
9529036 Systems and methods for test time outlier detection and correction in integrated circuit testing Reed Linde, Avi Golan 2016-12-27
8872538 Systems and methods for test time outlier detection and correction in integrated circuit testing Reed Linde, Avi Golan 2014-10-28
8781773 System and methods for parametric testing Leonid Gurov, Alexander Chufarovsky, Reed Linde 2014-07-15
8421494 Systems and methods for test time outlier detection and correction in integrated circuit testing Reed Linde, Avi Golan 2013-04-16
8112249 System and methods for parametric test time reduction Leonid Gurov, Alexander Chufarovsky 2012-02-07
8069130 Methods and systems for semiconductor testing using a testing scenario language 2011-11-29
7969174 Systems and methods for test time outlier detection and correction in integrated circuit testing Reed Linde, Avi Golan 2011-06-28
7777515 Methods and systems for semiconductor testing using reference dice 2010-08-17
7737716 Methods and systems for semiconductor testing using reference dice 2010-06-15
7679392 Methods and systems for semiconductor testing using reference dice 2010-03-16
7567947 Methods and systems for semiconductor testing using a testing scenario language 2009-07-28
7532024 Methods and systems for semiconductor testing using reference dice 2009-05-12
7528622 Methods for slow test time detection of an integrated circuit during parallel testing Reed Linde, Avi Golan 2009-05-05
7340359 Augmenting semiconductor's devices quality and reliability Nir Erez 2008-03-04