| 10118200 |
System and method for binning at final test |
Reed Linde |
2018-11-06 |
| 9529036 |
Systems and methods for test time outlier detection and correction in integrated circuit testing |
Reed Linde, Avi Golan |
2016-12-27 |
| 8872538 |
Systems and methods for test time outlier detection and correction in integrated circuit testing |
Reed Linde, Avi Golan |
2014-10-28 |
| 8781773 |
System and methods for parametric testing |
Leonid Gurov, Alexander Chufarovsky, Reed Linde |
2014-07-15 |
| 8421494 |
Systems and methods for test time outlier detection and correction in integrated circuit testing |
Reed Linde, Avi Golan |
2013-04-16 |
| 8112249 |
System and methods for parametric test time reduction |
Leonid Gurov, Alexander Chufarovsky |
2012-02-07 |
| 8069130 |
Methods and systems for semiconductor testing using a testing scenario language |
— |
2011-11-29 |
| 7969174 |
Systems and methods for test time outlier detection and correction in integrated circuit testing |
Reed Linde, Avi Golan |
2011-06-28 |
| 7777515 |
Methods and systems for semiconductor testing using reference dice |
— |
2010-08-17 |
| 7737716 |
Methods and systems for semiconductor testing using reference dice |
— |
2010-06-15 |
| 7679392 |
Methods and systems for semiconductor testing using reference dice |
— |
2010-03-16 |
| 7567947 |
Methods and systems for semiconductor testing using a testing scenario language |
— |
2009-07-28 |
| 7532024 |
Methods and systems for semiconductor testing using reference dice |
— |
2009-05-12 |
| 7528622 |
Methods for slow test time detection of an integrated circuit during parallel testing |
Reed Linde, Avi Golan |
2009-05-05 |
| 7340359 |
Augmenting semiconductor's devices quality and reliability |
Nir Erez |
2008-03-04 |