Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11852684 | Methods and systems for detecting defects on an electronic assembly | Gal Peled, Dan Sebban, Shaul Teplinsky | 2023-12-26 |
| 11650250 | Methods and systems for detecting defects on an electronic assembly | Gal Peled, Dan Sebban, Shaul Teplinsky | 2023-05-16 |
| 8838408 | Misalignment indication decision system and method | Reed Linde, Dan GLOTTER, Alexander Chufarovsky | 2014-09-16 |
| 8781773 | System and methods for parametric testing | Alexander Chufarovsky, Gil Balog, Reed Linde | 2014-07-15 |
| 8112249 | System and methods for parametric test time reduction | Alexander Chufarovsky, Gil Balog | 2012-02-07 |