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System and method for binning at final test |
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System and method for binning at final test |
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Systems and methods for test time outlier detection and correction in integrated circuit testing |
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Systems and methods for test time outlier detection and correction in integrated circuit testing |
Gil Balog, Avi Golan |
2014-10-28 |
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Misalignment indication decision system and method |
Dan GLOTTER, Alexander Chufarovsky, Leonid Gurov |
2014-09-16 |
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System and methods for parametric testing |
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Systems and methods for test time outlier detection and correction in integrated circuit testing |
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Systems and methods for test time outlier detection and correction in integrated circuit testing |
Gil Balog, Avi Golan |
2011-06-28 |
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Methods for slow test time detection of an integrated circuit during parallel testing |
Gil Balog, Avi Golan |
2009-05-05 |
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Ultra low pin count interface for die testing |
Sunil Gupta, Rich Fackenthal |
2008-07-29 |
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Memory defect detection and self-repair technique |
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2007-02-13 |