Avi Golan — 8 Patents at Optimaltest

Avi Golan has been granted 8 US patents while listed as an inventor at Optimaltest. The first was granted in 2007 and the most recent in December 2016. Avi Golan ranks #600,572 of 4,157,543 US inventors in our database (top 14.4%). Patent records list Avi Golan in Nes Ziona, IL.

Patents per Year

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Showing 1–8 of 8 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
9529036	Systems and methods for test time outlier detection and correction in integrated circuit testing	Gil Balog, Reed Linde	2016-12-27
8945632	Methods and compositions for inhibiting the nuclear factor κB pathway	Jacob GOPAS, Janet Ozer, Nadav Eisner, Adelbert Bacher, Wolfgang Eisenreich +2 more	2015-02-03
8872538	Systems and methods for test time outlier detection and correction in integrated circuit testing	Gil Balog, Reed Linde	2014-10-28
8421494	Systems and methods for test time outlier detection and correction in integrated circuit testing	Gil Balog, Reed Linde	2013-04-16
8285752	System and method for maintaining a plurality of summary levels in a single table	Alon Lubin, Nir Tzur, Yossi Kachlon	2012-10-09	$11,224,000
7969174	Systems and methods for test time outlier detection and correction in integrated circuit testing	Gil Balog, Reed Linde	2011-06-28
7528622	Methods for slow test time detection of an integrated circuit during parallel testing	Gil Balog, Reed Linde	2009-05-05
7208969	Optimize parallel testing	—	2007-04-24

Avi Golan — 8 Patents

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