| 12339305 |
Method and system for real time outlier detection and product re-binning |
Arie Peltz, Dan Sebban |
2025-06-24 |
| 12079554 |
Augmented reliability models for design and manufacturing |
Dan Sebban, Craig Hillman, Ashok Alagappan |
2024-09-03 |
| 11907095 |
Methods of smart pairing |
Bruce A. Phillips, Michael Schuldenfrei, Dan Sebban |
2024-02-20 |
| 11852668 |
Method and system for real time outlier detection and product re-binning |
Arie Peltz, Dan Sebban |
2023-12-26 |
| 11852684 |
Methods and systems for detecting defects on an electronic assembly |
Leonid Gurov, Gal Peled, Dan Sebban |
2023-12-26 |
| 11829125 |
Augmenting reliability models for manufactured products |
Bruce A. Phillips, Michael Schuldenfrei, Dan Sebban |
2023-11-28 |
| 11789074 |
Parameter space reduction for device testing |
James C. Nagle, Stephen Thung, Sergey Kizunov |
2023-10-17 |
| 11650250 |
Methods and systems for detecting defects on an electronic assembly |
Leonid Gurov, Gal Peled, Dan Sebban |
2023-05-16 |
| 11475187 |
Augmented reliability models for design and manufacturing |
Dan Sebban, Craig Hillman, Ashok Alagappan |
2022-10-18 |
| 11402419 |
Method and system for real time outlier detection and product re-binning |
Arie Peltz, Dan Sebban |
2022-08-02 |
| 11143689 |
Method and system for data collection and analysis for semiconductor manufacturing |
Michael Schuldenfrei, Dan Sebban |
2021-10-12 |
| 11068478 |
Augmenting reliability models for manufactured products |
Bruce A. Phillips, Michael Schuldenfrei, Dan Sebban |
2021-07-20 |
| 11061795 |
Methods of smart pairing |
Bruce A. Phillips, Michael Schuldenfrei, Dan Sebban |
2021-07-13 |
| 10794955 |
Methods and systems for testing a tester |
Hagay Gur, Dan GLOTTER |
2020-10-06 |
| 9885751 |
Dynamic process for adaptive tests |
Eran Rousseau, Arie Peltz |
2018-02-06 |
| 9767459 |
Detection of counterfeit electronic items |
Dan Sebban, Bruce A. Phillips |
2017-09-19 |