Issued Patents All Time
Showing 26–37 of 37 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7053383 | Method and apparatus for rapid sample preparation in a focused ion beam microscope | — | 2006-05-30 |
| 6821791 | Method for reworking metal layers on integrated circuit bond pads | Roger J. Stierman, Gregory B. Shinn | 2004-11-23 |
| 6777674 | Method for manipulating microscopic particles and analyzing | John Mark Anthony | 2004-08-17 |
| 6570170 | Total release method for sample extraction from a charged-particle instrument | — | 2003-05-27 |
| 6561868 | System and method for controlling a polishing machine | Henry Litzmann Edwards, Sung-Jen Fang | 2003-05-13 |
| 6534327 | Method for reworking metal layers on integrated circuit bond pads | Roger J. Stierman, Gregory B. Shinn | 2003-03-18 |
| 6435398 | Method for chemically reworking metal layers on integrated circuit bond pads | Cheryl Hartfield | 2002-08-20 |
| 6420722 | Method for sample separation and lift-out with one cut | Rocky Kruger, Cheryl Hartfield | 2002-07-16 |
| 5641906 | Apparatus and method for automated non-destructive inspection of integrated circuit packages | — | 1997-06-24 |
| 5627320 | Apparatus and method for automated non-destructive inspection of integrated circuit packages | — | 1997-05-06 |
| 5046363 | Apparatus for rapid non-destructive measurement of die attach quality in packaged integrated circuits | — | 1991-09-10 |
| 4622836 | Loft and lie calibration machine | Dabbs Clayton Long, Gerald R. Anderson, Dale L. Linman | 1986-11-18 |