Issued Patents All Time
Showing 26–28 of 28 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7475317 | Automatic test pattern generation | Erik Jan Marinissen, Hendrik Dirk Lodewijk Hollmann | 2009-01-06 |
| 7076709 | Testing of circuit with plural clock domains | Sandeep Kumar Goel | 2006-07-11 |
| 6988230 | Test arrangement for assemblages of intergrated circuit blocks | Thomas Waayers, Guillaume E. A. Lousberg | 2006-01-17 |