Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9678142 | Two-step interconnect testing of semiconductor dies | Julien Ryckaert, Dimitri Linten | 2017-06-13 |
| 9568536 | Transition delay detector for interconnect test | Sandeep Kumar Goel | 2017-02-14 |
| 9239359 | Test access architecture for TSV-based 3D stacked ICS | Jacobus Verbree, Mario Konijnenburg, Chun-Chuan Chi | 2016-01-19 |
| 9041411 | Testing of an integrated circuit that contains secret information | Sandeep Kumar Goel, Andre Krijn Nieuwland, Hubertus G. H. Vermuelen, Hendrikus Petrus Elisabeth Vranken | 2015-05-26 |
| 8914689 | Controlled toggle rate of non-test signals during modular scan testing of an integrated circuit | Sergej Deutsch | 2014-12-16 |
| 8773157 | Test circuit for testing through-silicon-vias in 3D integrated circuits | Mustafa Badaroglu, Paul Marchal | 2014-07-08 |
| 8680874 | On-chip testing using time-to-digital conversion | Nikolaos Minas | 2014-03-25 |
| 8593170 | Method and device for testing TSVS in a 3D chip stack | Geert Van der Plas, Nikolaos Minas, Paul Marchal | 2013-11-26 |
| 8539292 | Testing of an integrated circuit that contains secret information | Andre Krijn Nieuwland, Sandeepkumar Goel, Hubertus Gerardus Hendrikus Vermeulen, Hendrikus Petrus Elisabeth Vranken | 2013-09-17 |
| 7620866 | Test access architecture and method of testing a module in an electronic circuit | Thomas Waayers | 2009-11-17 |
| 7475317 | Automatic test pattern generation | Hubertus Gerardus Hendrikus Vermeulen, Hendrik Dirk Lodewijk Hollmann | 2009-01-06 |
| 6829736 | Method of testing a memory | Guillaume E. A. Lousberg, Paul Wielage | 2004-12-07 |
| 6721911 | Method and apparatus for testing a memory array using compressed responses | Guillaume E. A. Lousberg, Paul Wielage | 2004-04-13 |
| 6330698 | Method for making a digital circuit testable via scan test | Marinus Muijen | 2001-12-11 |
| 6061284 | Core test control | Johannes Dingenus Dingemanse, Clemens R. Wouters, Guillaum E. A. Lousberg, Gerardus A. A. Bos, Robert G. J. Arendsen | 2000-05-09 |