Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7124340 | Low pin count, high-speed boundary scan testing | Hendrikus Petrus Elisabeth Vranken, Thomas Waayers, David Lelouvier, Herve Fleury | 2006-10-17 |
| 6131173 | Clock domain test isolation | Johan C. Meirlevede, Jacobus A. M. Jacobs, Guillaume E. A. Lousberg | 2000-10-10 |
| 6061284 | Core test control | Johannes Dingenus Dingemanse, Erik Jan Marinissen, Clemens R. Wouters, Guillaum E. A. Lousberg, Robert G. J. Arendsen | 2000-05-09 |