Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7898447 | Methods and systems for testing digital-to-analog converter/amplifier circuits | Yoshikuni GOSHIMA, Seiichi Tsuchiya, John Kay, Chising Lai | 2011-03-01 |
| 7521689 | Deflector for equipment of electron beam lithography and equipment of electron beam lithography | Kenji Ohtoshi, Tetsuro Nishiyama | 2009-04-21 |
| 7463173 | Charged particle beam apparatus, abnormality detecting method for DA converter unit, charged particle beam writing method, and mask | Akira Noma | 2008-12-09 |