Issued Patents All Time
Showing 26–28 of 28 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6563330 | Probe card and method of testing wafer having a plurality of semiconductor devices | Shigeyuki Maruyama, Naoyuki Watanabe, Yoshito Konno, Eiji Yoshida, Toshiyuki Honda +2 more | 2003-05-13 |
| 6410354 | Semiconductor substrate test device and method | Shigeyuki Maruyama, Naoyuki Watanabe, Akira Sawamori | 2002-06-25 |
| 6203332 | Attachment structure of semiconductor device socket | Kazuhiro Tashiro | 2001-03-20 |