Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12346029 | Curved reticle by mechanical and phase bending along orthogonal axes | Donis Flagello, Daniel Gene Smith, Michael Binnard | 2025-07-01 |
| 11099483 | Euv lithography system for dense line patterning | Donis Flagello, David M. Williamson, Daniel Gene Smith, Michael Binnard | 2021-08-24 |
| 11061338 | High-resolution position encoder with image sensor and encoded target pattern | Jonathan K. Wells, Paul Derek Coon, Matthew Rosa, Johnathan Agustin Marquez, Michael Binnard +3 more | 2021-07-13 |
| 10890849 | EUV lithography system for dense line patterning | Donis Flagello, David M. Williamson, Daniel Gene Smith, Michael Binnard | 2021-01-12 |
| 10871708 | Spatial-frequency matched wafer alignment marks, wafer alignment and overlay measurement and processing using multiple different mark designs on a single layer | Steven Douglas Slonaker | 2020-12-22 |
| 9077637 | Determining a physical location of a wireless mobile device | Kieran Gerard Anthony Boland, Telemaque Ndizihiwe, Mark E. Wallace | 2015-07-07 |
| 8953471 | Counteracting spam in voice over internet protocol telephony systems | Kieran Gerard Anthony Boland, Telemaque Ndizihiwe, Mark E. Wallace | 2015-02-10 |
| 8755331 | Determining a physical location of a wireless mobile device | Kieran Gerard Anthony Boland, Telemaque Ndizihiwe, Mark E. Wallace | 2014-06-17 |
| 8448060 | Method, system and software tool for processing an electronic form | Michael Desmond, Maire Kehoe, Mark E. Wallace | 2013-05-21 |
| 8438507 | Systems and methods for adjusting a lithographic scanner | Koichi Fujii | 2013-05-07 |
| 8300214 | System and method for an adjusting optical proximity effect for an exposure apparatus | Steven Douglas Slonaker | 2012-10-30 |
| 6943882 | Method to diagnose imperfections in illuminator of a lithographic tool | Steven Douglas Slonaker | 2005-09-13 |