Issued Patents All Time
Showing 1–16 of 16 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10501315 | Analytical nanoscope on a chip for sub-optical resolution imaging | Alokik Kanwal, Arooj A. Aslam | 2019-12-10 |
| 9861524 | Smart shunt devices and methods | Gordon Albert Thomas, Alokik Kanwal | 2018-01-09 |
| 9689829 | Nanoprobe and methods of use | Camelia Prodan, Alokik Kanwal, Gordon Albert Thomas | 2017-06-27 |
| 8571835 | Vibration powered impact recorder (VPIR) | Gordon Albert Thomas | 2013-10-29 |
| 8546027 | System and method for directed self-assembly technique for the creation of carbon nanotube sensors and bio-fuel cells on single plane | Zafar Iqbal, Alokik Kanwal | 2013-10-01 |
| 8257566 | Nanotube device and method of fabrication | Zafar Iqbal, Amit Goyal, Sheng Liu | 2012-09-04 |
| 8088091 | No clog shunt using a compact fluid drag path | Gordon Albert Thomas, Sheng Liu | 2012-01-03 |
| 7964143 | Nanotube device and method of fabrication | Amit Goyal, Zafar Iqbal, Sheng Liu | 2011-06-21 |
| 7736979 | Method of forming nanotube vertical field effect transistor | Amit Goyal | 2010-06-15 |
| 7581203 | Method and apparatus for manufacturing multiple circuit patterns using a multiple project mask | Warren K. Waskiewicz | 2009-08-25 |
| 6977128 | Multi-layered semiconductor structure | David M. Boulin, Isik C. Kizilyalli, Nace Layadi, Masis Mkrtchyan | 2005-12-20 |
| 6706609 | Method of forming an alignment feature in or on a multi-layered semiconductor structure | David M. Boulin, Isik C. Kizilyalli, Nace Layadi, Masis Mkrtchyan | 2004-03-16 |
| 6576529 | Method of forming an alignment feature in or on a multilayered semiconductor structure | David M. Boulin, Isik C. Kizilyalli, Nace Layadi, Masis Mkrtchyan | 2003-06-10 |
| 6440816 | Alignment mark fabrication process to limit accumulation of errors in level to level overlay | Isik C. Kizilyalli | 2002-08-27 |
| 5906902 | Manufacturing system error detection | — | 1999-05-25 |
| 5824441 | Lithographic process for device fabrication utilizing back-scattered electron beam signal intensity for alignment | Masis Mkrtchyan | 1998-10-20 |