Issued Patents All Time
Showing 26–42 of 42 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10852641 | Thermal nanolithography method and system | — | 2020-12-01 |
| 10775405 | Method of and system for performing defect detection on or characterization of a layer of a semiconductor element or semi-manufactured semiconductor element | Maarten Hubertus van Es, Rutger Meijer Timmerman Thijssen | 2020-09-15 |
| 10746702 | Method of tuning parameter settings for performing acoustic scanning probe microscopy for subsurface imaging, scanning probe microscopy system, and computer program product | Rutger Meijer Timmerman Thijssen, Maarten Hubertus van Es | 2020-08-18 |
| 10712674 | Method of determining an overlay error, manufacturing method and system for manufacturing of a multilayer semiconductor device, and semiconductor device manufactured thereby | Stefan Kuiper, Erwin John Van Zwet, Stefan Michael Bruno Bäumer | 2020-07-14 |
| 10697998 | Method of performing surface measurements on a surface of a sample, and scanning probe microscopy system therefore | Aliasghar Keyvani Janbahan | 2020-06-30 |
| 10663874 | Alignment system and method | — | 2020-05-26 |
| 10578643 | Determining interaction forces in a dynamic mode AFM during imaging | Mehmet Selman Tamer | 2020-03-03 |
| 10495667 | Method of positioning a carrier on a flat surface, and assembly of a carrier and a positioning member | Jasper Winters, William Edward Crowcombe, Teunis Cornelis van den Dool, Geerten Frans Ijsbrand Kramer, Albert Dekker | 2019-12-03 |
| 10488433 | Positioning arm for and method of placing a scan head on a support surface | Jasper Winters, William Edward Crowcombe | 2019-11-26 |
| 10338098 | Thermal probe for a near-field thermal microscope and method for generating a thermal map | Roy Jacobus Franciscus Bijster | 2019-07-02 |
| 10067158 | System and method of performing scanning probe microscopy on a substrate surface | Jasper Winters, William Edward Crowcombe, Teunis Cornelis van den Dool, Geerten Frans Ijsbrand Kramer | 2018-09-04 |
| 9897626 | Scanning probe microscope with a reduced Q-factor | Femke Chantal Tabak, Maarten Hubertus van Es | 2018-02-20 |
| 9766266 | Method of advancing a probe tip of a scanning microscopy device towards a sample surface, and device therefore | Geerten Frans Ijsbrand Kramer, Teunis Cornelis van den Dool | 2017-09-19 |
| 9476908 | High throughput microscopy device | Rens Van Den Braber, Teunis Cornelis van den Dool, Niek Rijnveld | 2016-10-25 |
| 9329202 | Calibration of a mechanical property of SPM cantilevers | — | 2016-05-03 |
| 9274138 | High throughput scanning probe microscopy device | Teunis Cornelis van den Dool, Niek Rijnveld | 2016-03-01 |
| 8914910 | Probe calibration | — | 2014-12-16 |