Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6154040 | Apparatus for testing an electronic device | Minoru Doi | 2000-11-28 |
| 5930269 | Testing system for semiconductor device without influence of defective device | Atsushi Nigorikawa | 1999-07-27 |