Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5930269 | Testing system for semiconductor device without influence of defective device | Teruaki Tsukamoto | 1999-07-27 |
| 4389723 | High-speed pattern generator | Hiroshi Yokoyama, Takanori Fujieda | 1983-06-21 |