JP

Jacob C. H. Phang

NS National University Of Singapore: 9 patents #23 of 1,623Top 2%
SP Semicaps Pte: 4 patents #4 of 16Top 25%
IE Institute Of Materials Research And Engineering: 2 patents #6 of 38Top 20%
AM AMD: 1 patents #5,683 of 9,279Top 65%
📍 Singapore, SG: #434 of 13,971 inventorsTop 4%
Overall (All Time): #324,455 of 4,157,543Top 8%
15
Patents All Time

Issued Patents All Time

Showing 1–15 of 15 patents

Patent #TitleCo-InventorsDate
8891240 Apparatus and method for cooling a semiconductor device Choon Meng Chua, Lian Ser Koh, Sze Wei Choong 2014-11-18
RE43757 Rotational stage for high speed, large area scanning in focused beam systems Yong Liu, Daniel S. H. Chan 2012-10-23
7623982 Method of testing an electronic circuit and apparatus thereof Choon Meng Chua, Alfred Cheng Teck Quah, Soon Huat Tan, Lian Ser Koh 2009-11-24
7456032 Method and system for measuring laser induced phenomena changes in a semiconductor device Choon Meng Chua, Lian Ser Koh, Hoo Yin Ng, Soon Huat Tan 2008-11-25
6911656 Rotational stage for high speed, large area scanning in focused beam systems Yong Liu, Daniel S. H. Chan 2005-06-28
6897664 Laser beam induced phenomena detection Michael R. Bruce, Gregory A. Dabney, Palaniappan Muthupalaniappan, Jiann Min Chin, Richard Wilcox +6 more 2005-05-24
6777688 Rotational stage for high speed, large area scanning in focused beam systems Yong Liu, Daniel S. H. Chan 2004-08-17
6608305 Selective deposition of a particle beam based on charging characteristics of a sample Wong Wai Kin, John Thong 2003-08-19
6556029 Pulsed single contact optical beam induced current analysis of integrated circuits Chin Jiann Min, Sivaramakrishna Kolachina, Daniel S. H. Chan 2003-04-29
6320194 Portable high resolution scanning electron microscope column using permanent magnet electron lenses Anjam Khursheed, John Thong 2001-11-20
6057553 Portable high resolution scanning electron microscope column using permanent magnet electron lenses Anjam Khursheed, John Thong 2000-05-02
5724131 Integrated emission microscope for panchromatic imaging, continuous wavelength spectroscopy and selective area spectroscopic mapping Wai Kin Chim, Daniel S. H. Chan, Jing Mei Tao, Yong Liu 1998-03-03
5486769 Method and apparatus for measuring quantitative voltage contrast Wai Kim Chim, Daniel S. H. Chan 1996-01-23
5468967 Double reflection cathodoluminescence detector with extremely high discrimination against backscattered electrons Daniel S. H. Chan, Kin-Wai Leong 1995-11-21
5264704 High efficiency cathodoluminescence detector with high discrimination against backscattered electrons Daniel S. H. Chan, Kin Leong Pey 1993-11-23