Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8758935 | Soluble polymer with multi-stable electric states and products comprising such polymer | Qi-Dan Ling, Jian-Kuang Zhu, Chunxiang Zhu, En-Tang Kang, Koon Gee Neoh | 2014-06-24 |
| RE43757 | Rotational stage for high speed, large area scanning in focused beam systems | Yong Liu, Jacob C. H. Phang | 2012-10-23 |
| 6911656 | Rotational stage for high speed, large area scanning in focused beam systems | Yong Liu, Jacob C. H. Phang | 2005-06-28 |
| 6777688 | Rotational stage for high speed, large area scanning in focused beam systems | Yong Liu, Jacob C. H. Phang | 2004-08-17 |
| 6556029 | Pulsed single contact optical beam induced current analysis of integrated circuits | Chin Jiann Min, Sivaramakrishna Kolachina, Jacob C. H. Phang | 2003-04-29 |
| 5961860 | Pulse laser induced removal of mold flash on integrated circuit packages | Yong Lu, Teck Seng Low | 1999-10-05 |
| 5724131 | Integrated emission microscope for panchromatic imaging, continuous wavelength spectroscopy and selective area spectroscopic mapping | Wai Kin Chim, Jacob C. H. Phang, Jing Mei Tao, Yong Liu | 1998-03-03 |
| 5486769 | Method and apparatus for measuring quantitative voltage contrast | Wai Kim Chim, Jacob C. H. Phang | 1996-01-23 |
| 5468967 | Double reflection cathodoluminescence detector with extremely high discrimination against backscattered electrons | Kin-Wai Leong, Jacob C. H. Phang | 1995-11-21 |
| 5264704 | High efficiency cathodoluminescence detector with high discrimination against backscattered electrons | Jacob C. H. Phang, Kin Leong Pey | 1993-11-23 |