Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6259268 | Voltage stress testable embedded dual capacitor structure and process for its testing | Andrew J. Morrish, Muthanna Salman | 2001-07-10 |
| 5629563 | Component stacking in multi-chip semiconductor packages | Hem Takiar, Uli H. Hegel, Peter Howard Spalding, Michelle M. Hou-Chang, Martin A. Delateur | 1997-05-13 |