Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9244574 | Reducing ion-migration and corrosion in electrodes | John Weinerth, Victor K. Kolesnichenko | 2016-01-26 |
| 6259268 | Voltage stress testable embedded dual capacitor structure and process for its testing | James L. Crozier, Andrew J. Morrish | 2001-07-10 |