Issued Patents All Time
Showing 51–71 of 71 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7067328 | Methods, devices and compositions for depositing and orienting nanostructures | Robert S. Dubrow, Linda Romano | 2006-06-27 |
| 7064372 | Large-area nanoenabled macroelectronic substrates and uses therefor | Xiangfeng Duan, Chunming Niu, Stephen Empedocles, Linda Romano, Jian Chen +4 more | 2006-06-20 |
| 7051945 | Applications of nano-enabled large area macroelectronic substrates incorporating nanowires and nanowire composites | Stephen Empedocles, Chunming Niu, Xianfeng Duan | 2006-05-30 |
| 6992761 | Broad range light detection system | Douglas N. Modlin, Rick V. Stellmacher, Jonathan Petersen, Todd French | 2006-01-31 |
| 6962823 | Methods of making, positioning and orienting nanostructures, nanostructure arrays and nanostructure devices | Stephen Empedocles, Larry Bock, Calvin Y. H. Chow, Xianfeng Duan, Chungming Niu +3 more | 2005-11-08 |
| 6925478 | Practical pseudo-asynchronous filter architecture | Alireza Jabbari, Michael Sogard | 2005-08-02 |
| 6902703 | Integrated sample-processing system | Samuel A. Marquiss, Christopher G. Cesar, Jon F. Petersen, Amer El-Hage, Glenn R. Edwards +3 more | 2005-06-07 |
| 6838051 | Integrated sample-processing system | Samuel A. Marquiss, Christopher G. Cesar, Jon F. Petersen, Amer El-Hage, Glenn R. Edwards +3 more | 2005-01-04 |
| 6674512 | Interferometer system for a semiconductor exposure system | W. Thomas Novak, Fuyuhiko Inoue | 2004-01-06 |
| 6521903 | Deflection noise reduction in charged particle beam lithography | James D. Rockrohr | 2003-02-18 |
| 6509971 | Interferometer system | Fuyuhiko Inoue | 2003-01-21 |
| 6498335 | Broad range light detection system | Douglas N. Modlin, Rick V. Stellmacher | 2002-12-24 |
| 6455821 | System and method to control temperature of an article | — | 2002-09-24 |
| 6326605 | Broad range light detection system | Douglas N. Modlin, Rick V. Stellmacher | 2001-12-04 |
| 6317207 | Frequency-domain light detection device | Todd French, Douglas N. Modlin | 2001-11-13 |
| 6310687 | Light detection device with means for tracking sample sites | Douglas N. Modlin | 2001-10-30 |
| 6133987 | Technique for reducing pattern placement error in projection electron-beam lithography | — | 2000-10-17 |
| 5729185 | Acoustic wave filter package lid attachment apparatus and method utilizing a novolac epoxy based seal | Gary Carl Johnson, Steven R. Young, Michael J. Anderson | 1998-03-17 |
| 5726610 | Saw filter device for radio tranceiver utilizing different coupling coefficient ratios | Donald E. Allen, Philip P. Kwan | 1998-03-10 |
| 5632909 | Filter | Donald E. Allen, Philip P. Kwan | 1997-05-27 |
| 5160845 | Alignment technique for masked ion beam lithography | John C. Wolfe, John N. Randall | 1992-11-03 |