Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12099078 | Probe card and wafer testing assembly thereof | Yi-Chien Tsai, Yu-Wen Chou, Yu-Shan Hu | 2024-09-24 |
| 11402407 | Positionable probe card and manufacturing method thereof | Zhi-Wei Su, Tzung-Je Tzeng, Wen-Chi Chen, Hsueh-Chih Wu, Sheng-Wei Lin +4 more | 2022-08-02 |
| 11150269 | Probe head for high frequency signal test and medium or low frequency signal test at the same time | Hui-Pin Yang, Shang-Jung Hsieh, Yu-Wen Chou, Ching-Fang Yu, Chin-Tien Yang | 2021-10-19 |
| 9643271 | Method for making support structure for probing device | Kun-Han Hsieh, Kuan-Chun Chou, Tsung-Yi Chen, Chung-Tse Lee | 2017-05-09 |
| 9442135 | Method of manufacturing space transformer for probe card | Kuan-Chun Chou, Hui-Pin Yang, Chien-Kuei Wang | 2016-09-13 |