Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9823272 | Wafer testing probe card | Ming-Chi Chen, Tien-Chia Li, Dai-Jin Yeh, Tsung-Yi Chen | 2017-11-21 |
| 9442135 | Method of manufacturing space transformer for probe card | Kuan-Chun Chou, Huo-Kang Hsu, Hui-Pin Yang | 2016-09-13 |