Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10119991 | Vertical probe device and supporter used in the same | Tsung-Yi Chen, Horng-Kuang Fan, Ching-Hung Yang, Chung-Tse Lee, Chia-Yuan Kuo +2 more | 2018-11-06 |
| 10041974 | Probe head of vertical probe card | Yi-Ching Chuo | 2018-08-07 |
| 9857393 | Testing device and assembling method thereof | Chin-Yi Lin, Ching-Hung Yang | 2018-01-02 |
| 9823272 | Wafer testing probe card | Ming-Chi Chen, Dai-Jin Yeh, Tsung-Yi Chen, Chien-Kuei Wang | 2017-11-21 |
| 9638716 | Positioner of probe card and probe head of probe card | Tzu-Yang Chen, Shang-Jung Hsieh, Chung-Tse Lee, Tsung-Yi Chen, Chia-Yuan Kuo +1 more | 2017-05-02 |
| 9618536 | Probe needle and probe module using the same | Chia-Yuan Kuo, Ming-Chi Chen, Chien-Chou Wu, Tsung-Yi Chen | 2017-04-11 |
| 9588141 | Probe device having spring probe | Tsung-Yi Chen, Chien-Chou Wu, Ting-Hsin KUO | 2017-03-07 |
| 9535092 | Spring probe | Ting-Hsin KUO, Tsung-Yi Chen, Yi-Lung Lee, Chien-Chou Wu | 2017-01-03 |
| 9465050 | Assembling method and maintaining method for vertical probe device | Tsung-Yi Chen, Horng-Kuang Fan, Ching-Hung Yang, Chung-Tse Lee, Chia-Yuan Kuo +1 more | 2016-10-11 |