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Probe device having spring probe |
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2017-08-29 |
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Assembly method of direct-docking probing device |
Ming-Chi Chen, Tsung-Yi Chen, Chung-Che Li |
2017-05-16 |
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Method for manufacturing space transformer by using carrier substrate made for chip package and provided with elongated contacts |
Chung-Tse Lee, Tsung-Yi Chen |
2017-05-09 |
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Probe needle and probe module using the same |
Chia-Yuan Kuo, Tien-Chia Li, Ming-Chi Chen, Tsung-Yi Chen |
2017-04-11 |
| 9588141 |
Probe device having spring probe |
Tsung-Yi Chen, Tien-Chia Li, Ting-Hsin KUO |
2017-03-07 |
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Spring probe |
Ting-Hsin KUO, Tsung-Yi Chen, Tien-Chia Li, Yi-Lung Lee |
2017-01-03 |
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Apparatus for probing die electricity and method for forming the same |
Chung-Tse Lee, Yi-Ming Chan |
2016-11-29 |
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Probing device |
Ming-Chi Chen, Chung-Che Li |
2016-05-24 |
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Probe card and manufacturing method thereof |
Chung-Tse Lee, Tsung-Yi Chen, Ming-Chi Chen |
2016-05-17 |
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Probing device and manufacturing method thereof |
Ming-Chi Chen, Chung-Che Li |
2016-01-12 |
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Apparatus for probing die electricity and method for forming the same |
Chung-Tse Lee, Yi-Ming Chan |
2015-10-13 |
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Apparatus and methods for Z-axis control and collision detection and recovery for waterjet cutting systems |
Jonathan M. Stewart, Thomas Pesek, Volker Kern, Daniel Chin, Felice M. Sciulli |
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Apparatus and methods for z-axis control and collision detection and recovery for waterjet cutting systems |
Jonathan M. Stewart, Thomas Pesek, Volker Kern, Daniel Chin, Felice M. Sciulli |
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