Issued Patents All Time
Showing 26–37 of 37 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7635445 | Method of separating a mold from a solidified layer disposed on a substrate | Byung-Jin Choi, Anshuman Cherala, Yeong-Jun Choi, Mario Johannes Meissl, Sidlgata V. Sreenivasan +3 more | 2009-12-22 |
| 7531025 | Method of creating a turbulent flow of fluid between a mold and a substrate | Nicholas A. Stacey, Daniel Babbs, Duane J. Voth, Mathew P. C. Watts, Van Nguyen Truskett +3 more | 2009-05-12 |
| 7491637 | Formation of conductive templates employing indium tin oxide | Sidlgata V. Sreenivasan, Byung-Jin Choi, Ronald D. Voisin | 2009-02-17 |
| 7473090 | Imprint lithography template to facilitate control of liquid movement | Pankaj Lad, Van Nguyen Truskett | 2009-01-06 |
| 7462028 | Partial vacuum environment imprinting | Anshuman Cherala, Pankaj Lad, Byung-Jin Choi | 2008-12-09 |
| 7309225 | Moat system for an imprint lithography template | Pankaj Lad | 2007-12-18 |
| 7281919 | System for controlling a volume of material on a mold | Steven C. Shackleton, Pankaj Lad, Van Nguyen Truskett | 2007-10-16 |
| 7281921 | Scatterometry alignment for imprint lithography | Michael Watts | 2007-10-16 |
| 7270533 | System for creating a turbulent flow of fluid between a mold and a substrate | Nicholas A. Stacey, Daniel Babbs, Duane J. Voth, Mathew P. C. Watts, Van Nguyen Truskett +3 more | 2007-09-18 |
| 7090716 | Single phase fluid imprint lithography method | Nicholas A. Stacey, Daniel Babbs, Duane J. Voth, Michael Watts, Van Nguyen Truskett +3 more | 2006-08-15 |
| 7027156 | Scatterometry alignment for imprint lithography | Michael Watts | 2006-04-11 |
| 7019835 | Method and system to measure characteristics of a film disposed on a substrate | Phillip D. Schumaker, Byung-Jin Choi, Sidlgata V. Sreenivasan, Michael Watts | 2006-03-28 |