Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12399356 | Microscope unit | Kenji Iwamoto, Takashi Honma | 2025-08-26 |
| 12386165 | Microscope unit | Takashi Honma | 2025-08-12 |
| D1009113 | Microscope unit | Kenji Iwamoto, Takashi Honma | 2023-12-26 |
| 10725262 | Lens holding mechanism and optical emitter | — | 2020-07-28 |
| D706847 | Microscope | Sadayuki Matsumiya, Kenji Okabe, Shigeru Ohtani, Kenji Iwamoto | 2014-06-10 |
| 8654351 | Offset amount calibrating method and surface profile measuring machine | Koichi Komatsu, Fumihiro Takemura, Sadaharu Arita, Kotaro Hirano | 2014-02-18 |
| 8650939 | Surface texture measuring machine and a surface texture measuring method | Sadayuki Matsumiya, Yoshiyuki Omori, Sadaharu Arita, Kotaro Hirano, Koichi Komatsu +1 more | 2014-02-18 |
| 6646748 | Surface profile measurement apparatus | Taizo Nakamura, Yoshio Saruki, Tatsuya Narumi | 2003-11-11 |
| 6621065 | Imaging probe | Seiji Shimokawa, Kenji Okabe | 2003-09-16 |
| 5963366 | Focus detection unit and microscope using the focus detection unit | Taizo Nakamura, Yuwu Zhang | 1999-10-05 |