Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6697162 | Optical interferometric measuring instrument and laser interference apparatus | Hisayoshi Sakai, Tetsuhiko Kubo | 2004-02-24 |
| 6646748 | Surface profile measurement apparatus | Taizo Nakamura, Tatsuya Narumi, Yasushi Fukumoto | 2003-11-11 |
| 6173504 | Measuring instrument, probe for the same, and measuring method | Yukiharu Ohtsuka, Yoshio Moriya | 2001-01-16 |
| 6065220 | Measuring instrument, probe for the same, and measuring method | Yukiharu Ohtsuka, Yoshio Moriya | 2000-05-23 |