Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11221201 | Profile measuring machine and profile measuring method | Kazunari Ishii | 2022-01-11 |
| 9442054 | Hardness tester having offset correction feature | Fumihiko Koshimizu | 2016-09-13 |
| 9417171 | Hardness tester | Fumihiko Koshimizu | 2016-08-16 |
| 8650939 | Surface texture measuring machine and a surface texture measuring method | Sadayuki Matsumiya, Yoshiyuki Omori, Sadaharu Arita, Kotaro Hirano, Yasushi Fukumoto +1 more | 2014-02-18 |
| 8654351 | Offset amount calibrating method and surface profile measuring machine | Yasushi Fukumoto, Koichi Komatsu, Sadaharu Arita, Kotaro Hirano | 2014-02-18 |
| 8578284 | Hardness testing device with a user interface for setting test locations | Kozo Ariga | 2013-11-05 |
| 8566735 | Hardness tester with a user interface for setting test locations | Kozo Ariga | 2013-10-22 |
| 7277818 | Method and program for leveling aspherical workpieces | Yukihiro Sakata | 2007-10-02 |
| 7142313 | Interaxis angle correction method | Takao Ishitoya | 2006-11-28 |
| 7096149 | Method for determining coordinate system for device under measurement, and coordinate measuring apparatus | Soichi Kadowaki, Naoji Horiuchi | 2006-08-22 |
| 6671973 | Surface texture measuring instrument and a method of adjusting an attitude of a work for the same | Minoru Katayama | 2004-01-06 |