YM

Yoshio Matsuda

Mitsubishi Electric: 61 patents #81 of 25,717Top 1%
YK Yoshida Kogyo K.K.: 28 patents #8 of 468Top 2%
YK Ykk: 26 patents #16 of 845Top 2%
TI Toray Industries: 3 patents #932 of 3,690Top 30%
RT Renesas Technology: 2 patents #1,374 of 3,337Top 45%
AP Amkor Technology Singapore Holding Pte.: 2 patents #154 of 289Top 55%
RE Renesas Electronics: 1 patents #2,739 of 4,529Top 65%
OC Okura Industrial Co.: 1 patents #18 of 51Top 40%
📍 Chandler, AZ: #14 of 3,331 inventorsTop 1%
🗺 Arizona: #82 of 32,909 inventorsTop 1%
Overall (All Time): #9,136 of 4,157,543Top 1%
125
Patents All Time

Issued Patents All Time

Showing 51–75 of 125 patents

Patent #TitleCo-InventorsDate
5416734 Bit line structure for semiconductor memory device Hideto Hidaka, Kazuyasu Fujishima 1995-05-16
5412380 Electronic crosspoint switching device operating at a high signal transmission rate Harufusa Kondoh, Hiromi Notani, Isamu Hayashi 1995-05-02
5373712 Warp-knit cloth for surface fastener Toru Yamamoto, Mitsutoshi Ishihara 1994-12-20
5375088 Random access memory with plurality of amplifier groups Kiyohiro Furutani, Koichiro Mashiko, Kazutami Arimoto, Noriaki Matsumoto 1994-12-20
5371714 Method and apparatus for driving word line in block access memory Kazuyasu Fujishima, Hideto Hidaka 1994-12-06
5353427 Semiconductor memory device for simple cache system with selective coupling of bit line pairs Kazuyasu Fujishima, Mikio Asakura 1994-10-04
5347270 Method of testing switches and switching circuit Harufusa Kondoh, Isamu Hayashi, Hiromi Notani 1994-09-13
5293598 Random access memory with a plurality of amplifier groups Kiyohiro Furutani, Koichiro Mashiko, Kazutami Arimoto, Noriaki Matsumoto 1994-03-08
5289417 Semiconductor memory device with redundancy circuit Tsukasa Ooishi, Kazutami Arimoto, Masaki Tsukude, Kazuyasu Fujishima 1994-02-22
5280443 Bit line structure for semiconductor memory device Hideto Hidaka, Kazuyasu Fujishima 1994-01-18
5267214 Shared-sense amplifier control signal generating circuit in dynamic type semiconductor memory device and operating method therefor Kazuyasu Fujishima, Kazutami Arimoto, Tsukasa Ooishi, Masaki Tsukude 1993-11-30
5250458 Method for manufacturing semiconductor memory device having stacked memory capacitors Katsuhiro Tsukamoto, Masahiro Shimizu, Kazuyasu Fujishima 1993-10-05
5226147 Semiconductor memory device for simple cache system Kazuyasu Fujishima, Mikio Asakura 1993-07-06
5226139 Semiconductor memory device with a built-in cache memory and operating method thereof Kazuyasu Fujishima, Hideto Hidaka, Mikio Asakura 1993-07-06
5222047 Method and apparatus for driving word line in block access memory Kazuyasu Fujishima, Hideto Hidaka 1993-06-22
5214601 Bit line structure for semiconductor memory device including cross-points and multiple interconnect layers Hideto Hidaka, Kazuyasu Fujishima 1993-05-25
5185744 Semiconductor memory device with test circuit Kazutami Arimoto, Kazuyasu Fujishima, Tsukasa Ooishi, Masaki Tsukude 1993-02-09
5184327 Semiconductor memory device having on-chip test circuit and method for testing the same Kazutami Arimoto, Tsukasa Ooishi, Masaki Tsukude, Kazuyasu Fujishima 1993-02-02
5179687 Semiconductor memory device containing a cache and an operation method thereof Hideto Hidaka, Kazuyasu Fujishima, Mikio Asakura 1993-01-12
5136543 Data descrambling in semiconductor memory device Kazuyasu Fujishima, Kazutami Arimoto, Masaki Tsukude, Tsukasa Oishi 1992-08-04
5132930 CMOS dynamic memory device having multiple flip-flop circuits selectively coupled to form sense amplifiers specific to neighboring data bit lines Kiyohiro Furutani, Koichiro Mashiko, Kazutami Arimoto, Noriaki Matsumoto 1992-07-21
5103426 Decoding circuit and method for functional block selection Hideto Hidaka, Kazuyasu Fujishima 1992-04-07
5088063 Semiconductor memory device having on-chip test circuit Kazutami Arimoto, Tsukasa Ooishi, Masaki Tsukude, Kazuyasu Fujishima 1992-02-11
5060230 On chip semiconductor memory arbitrary pattern, parallel test apparatus and method Kazutami Arimoto, Kazuyasu Fujishima, Tsukasa Ooishi, Masaki Tsukude 1991-10-22
5030586 Method for manufacturing semiconductor memory device having improved resistance to .alpha. particle induced soft errors Kazuyasu Fujishima 1991-07-09