YY

Yasuo Yamaguchi

Mitsubishi Electric: 95 patents #18 of 25,717Top 1%
AC Aisin Aw Co.: 24 patents #57 of 2,011Top 3%
NI Nidec: 18 patents #36 of 976Top 4%
RT Renesas Technology: 17 patents #86 of 3,337Top 3%
Ricoh Company: 6 patents #3,275 of 9,818Top 35%
MM Mitsubishi Motors: 5 patents #209 of 1,823Top 15%
MM Mitsubishi Materials: 4 patents #258 of 1,543Top 20%
MI Mitutoyo: 4 patents #230 of 721Top 35%
NB Nohmi Bosai: 2 patents #28 of 90Top 35%
SH Shinryo: 1 patents #9 of 33Top 30%
OC Otsuka Pharmaceutical Co.: 1 patents #681 of 1,273Top 55%
RE Ryoden Semiconductor System Engineering: 1 patents #111 of 195Top 60%
ML Mitsubishi Electric Engineering Company, Limited: 1 patents #138 of 352Top 40%
📍 Kyoto, JP: #15 of 140 inventorsTop 15%
Overall (All Time): #4,343 of 4,157,543Top 1%
178
Patents All Time

Issued Patents All Time

Showing 101–125 of 178 patents

Patent #TitleCo-InventorsDate
6563172 Semiconductor substrate processing method Yoshiko Yoshida, Hideki Naruoka, Yasuhiro Kimura, Toshiaki Iwamatsu, Yuuichi Hirano 2003-05-13
6545602 Fire alarm system Makoto Sakihara, Kouichi Hishino, Takahiro Oki, Munehiro Onji 2003-04-08
6514786 Method of manufacturing acceleration sensor Teruya Fukaura, Kunihiro Nakamura 2003-02-04
6509211 Semiconductor device having SOI structure and method of fabricating the same Shigenobu Maeda, Iijong Kim 2003-01-21
6509583 Semiconductor device formed on insulating layer and method of manufacturing the same Toshiaki Iwamatsu, Shigenobu Maeda, Shoichi Miyamoto, Akihiko Furukawa, Yasuo Inoue 2003-01-21
6507103 Semiconductor device Kunihiro Nakamura 2003-01-14
6465292 Method of manufacturing a semiconductor device having reduced power consumption without a reduction in the source/drain breakdown voltage Shigenobu Maeda, Toshiaki Iwamatsu 2002-10-15
6452249 Inductor with patterned ground shield Shigenobu Maeda, Yuuichi Hirano, Takashi Ipposhi, Takuji Matsumoto 2002-09-17
6441448 Semiconductor storage device Shigenobu Maeda, Hirotada Kuriyama 2002-08-27
6441450 Acceleration sensor and method of manufacturing the same Kunihiro Nakamura, Shiro Yamasaki, Teruya Fukaura 2002-08-27
6436792 Method of manufacturing semiconductor device Shigenobu Maeda, Yuuichi Hirano 2002-08-20
6424010 Method of manufacturing a semiconductor device having reduced power consumption without a reduction in the source/drain breakdown voltage Shigenobu Maeda, Toshiaki Iwamatsu 2002-07-23
6420751 Semiconductor device and method of manufacturing the same Shigenobu Maeda, Hirotada Kuriyama, Shigeto Maegawa 2002-07-16
6399460 Semiconductor device Hidekazu Yamamoto 2002-06-04
6373668 Semiconductor device 2002-04-16
6358783 Semiconductor device and method of manufacturing the same Tadashi Nishimura 2002-03-19
6351014 Semiconductor device having different field oxide sizes Yasuo Inoue, Tadashi Nishimura, Toshiaki Iwamatsu 2002-02-26
6340829 Semiconductor device and method for manufacturing the same Yuuichi Hirano, Shigeto Maegawa 2002-01-22
6335267 Semiconductor substrate and method of fabricating semiconductor device Toshiaki Iwamatsu, Takashi Ipposhi, Shigenobu Maeda, Yuichi Hirano 2002-01-01
6319805 Semiconductor device having metal silicide film and manufacturing method thereof Toshiaki Iwamatsu, Yasuo Inoue, Tadashi Nishimura 2001-11-20
6310377 Semiconductor device having an SOI structure Shigenobu Maeda, Il Jung Kim, Yasuo Inoue, Shigeto Maegawa, Takashi Ipposhi 2001-10-30
6274908 Semiconductor device having input-output protection circuit Takashi Ippooshi 2001-08-14
6271541 Semiconductor device with high gettering capability to impurity present in semiconductor layer of SOI substrate Hidekazu Yamamoto 2001-08-07
6249026 MOS Transistor with a buried oxide film containing fluorine Takuji Matsumoto, Takashi Ipposhi 2001-06-19
6236325 Position detector with irregularity detectable function and cable for use in the same Shingo Kuroki, Hiroaki Kawada 2001-05-22