TY

Tadaaki Yamauchi

Mitsubishi Electric: 36 patents #307 of 25,717Top 2%
RT Renesas Technology: 34 patents #15 of 3,337Top 1%
RE Renesas Electronics: 5 patents #829 of 4,529Top 20%
📍 Kasai, JP: #29 of 5,842 inventorsTop 1%
Overall (All Time): #25,831 of 4,157,543Top 1%
75
Patents All Time

Issued Patents All Time

Showing 51–75 of 75 patents

Patent #TitleCo-InventorsDate
6088286 Word line non-boosted dynamic semiconductor memory device Kazutami Arimoto 2000-07-11
6084386 Voltage generation circuit capable of supplying stable power supply voltage to load operating in response to timing signal Mitsue Takahashi, Mitsuya Kinoshita 2000-07-04
6064275 Internal voltage generation circuit having ring oscillator whose frequency changes inversely with power supply voltage 2000-05-16
6064557 Semiconductor device structured to be less susceptible to power supply noise Kyoji Yamasaki, Mikio Asakura 2000-05-16
6061808 Semiconductor memory device having a multibit test mode Mikio Asakura, Takashi Ito 2000-05-09
6003148 Semiconductor memory device allowing repair of a defective memory cell with a redundant circuit in a multibit test mode Mikio Asakura, Takashi Ito 1999-12-14
5982162 Internal voltage generation circuit that down-converts external power supply voltage and semiconductor device generating internal power supply voltage on the basis of reference voltage 1999-11-09
5978299 Semiconductor memory device having a voltage lowering circuit of which supplying capability increases when column system is in operation Kyoji Yamasaki, Mikio Asakura 1999-11-02
5973554 Semiconductor device structured to be less susceptible to power supply noise Kyoji Yamasaki, Mikio Asakura 1999-10-26
5917766 Semiconductor memory device that can carry out read disturb testing and burn-in testing reliably Takaharu Tsuji, Mikio Asakura, Koji Tanaka 1999-06-29
5875145 Semiconductor memory device having a voltage lowering circuit of which supplying capability increases when column system is in operation Kyoji Yamasaki, Mikio Asakura 1999-02-23
5838047 CMOS substrate biasing for threshold voltage control Kazutami Arimoto 1998-11-17
5812492 Control signal generation circuit and semiconductor memory device that can correspond to high speed external clock signal Takaharu Tsuji, Mikio Asakura 1998-09-22
5801451 Semiconductor device including a plurality of input buffer circuits receiving the same control signal 1998-09-01
5789808 Semiconductor device structured to be less susceptible to power supply noise Kyoji Yamasaki, Mikio Asakura 1998-08-04
5783957 Differential amplifier circuit, CMOS inverter, demodulator circuit for pulse-width modulation, and sampling circuit 1998-07-21
5744998 Internal voltage detecting circuit having superior responsibility Takashi Ito, Takaharu Tsuji 1998-04-28
5732034 Semiconductor memory device having an address key circuit for reducing power consumption Mikio Asakura, Takashi Ito 1998-03-24
5691955 Synchronous semiconductor memory device operating in synchronization with external clock signal 1997-11-25
5663912 Semiconductor memory device 1997-09-02
5640363 Semiconductor memory device Kiyohiro Furutani, Makiko Aoki 1997-06-17
5621343 Demodulator circuit which demodulates pulse width modulated signals used in a semiconductor integrated circuit 1997-04-15
5487043 Semiconductor memory device having equalization signal generating circuit Kiyohiro Furutani, Makiko Aoki 1996-01-23
5481497 Semiconductor memory device providing external output data signal in accordance with states of true and complementary read buses Hiroshi Miyamoto, Yoshikazu Morooka, Kiyohiro Furutani, Makiko Aoki 1996-01-02
5469402 Buffer circuit of a semiconductor memory device Kei Hamade, Yoshikazu Morooka 1995-11-21