KY

Kyoji Yamasaki

Mitsubishi Electric: 25 patents #671 of 25,717Top 3%
RT Renesas Technology: 3 patents #990 of 3,337Top 30%
MD Mitsubisih Denki: 1 patents #26 of 381Top 7%
RE Renesas Electronics: 1 patents #2,739 of 4,529Top 65%
Overall (All Time): #124,967 of 4,157,543Top 4%
30
Patents All Time

Issued Patents All Time

Showing 1–25 of 30 patents

Patent #TitleCo-InventorsDate
9888192 Imaging device Tatsuya KITAMORI, Fumihide Murao 2018-02-06
7288965 Semiconductor device and level conversion circuit Yasuhiko Tsukikawa 2007-10-30
7161387 Semiconductor device and level conversion circuit Yasuhiko Tsukikawa 2007-01-09
6809576 Semiconductor integrated circuit device having two types of internal power supply circuits 2004-10-26
6661729 Semiconductor device having test mode 2003-12-09
6657879 Semiconductor integrated circuit device with noise filter 2003-12-02
6631092 Semiconductor memory device capable of imposing large stress on transistor 2003-10-07
6594167 Semiconductor integrated circuit having a structure for equalizing interconnection lengths and memory module provided with the semiconductor integrated circuit Takayuki Miyamoto 2003-07-15
6519194 Semiconductor memory device with a rapid packet data input, capable of operation check with low speed tester Mitsunori Tsujino, Kazutoshi Hirayama 2003-02-11
6498760 Semiconductor device having test mode 2002-12-24
6486731 Semiconductor integrated circuit device capable of externally monitoring internal voltage Takashi Itou 2002-11-26
6433422 Semiconductor integrated circuit having semiconductor packages for mounting integrated circuit chips on both sides of a substrate 2002-08-13
6404687 Semiconductor integrated circuit having a self-refresh function 2002-06-11
6339357 Semiconductor integrated circuit device capable of externally monitoring internal voltage Takashi Itou 2002-01-15
6330173 Semiconductor integrated circuit comprising step-up voltage generation circuit Mikio Asakura 2001-12-11
6301190 Semiconductor memory device with a rapid packet data input, capable of operation check with low speed tester Mitsunori Tsujino, Kazutoshi Hirayama 2001-10-09
6285622 Semiconductor device Masaru Haraguchi, Yoshito Nakaoka 2001-09-04
6166966 Semiconductor memory device including data output circuit capable of high speed data output Yukiko Maruyama, Yutaka Ikeda 2000-12-26
6147398 Semiconductor device package Noriyuki Nakazato 2000-11-14
6065143 Semiconductor memory device capable of fast testing without externally considering address scramble or data scramble Yutaka Ikeda 2000-05-16
6064557 Semiconductor device structured to be less susceptible to power supply noise Mikio Asakura, Tadaaki Yamauchi 2000-05-16
6005294 Method of arranging alignment marks Takaharu Tsuji, Mikio Asakura 1999-12-21
5978299 Semiconductor memory device having a voltage lowering circuit of which supplying capability increases when column system is in operation Tadaaki Yamauchi, Mikio Asakura 1999-11-02
5973554 Semiconductor device structured to be less susceptible to power supply noise Mikio Asakura, Tadaaki Yamauchi 1999-10-26
5875145 Semiconductor memory device having a voltage lowering circuit of which supplying capability increases when column system is in operation Tadaaki Yamauchi, Mikio Asakura 1999-02-23