Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7298020 | Semiconductor device and method of manufacturing the same | Syuji Asano, Yoshiaki Nakayama | 2007-11-20 |
| 7016749 | System and method for product designing, and recording medium | Seigo Kuzumaki, Yoshio Shirai, Takatoshi Negishi, Kazuhiro Miyauchi, Masato Kato +10 more | 2006-03-21 |
| 6748704 | Factory layout | Shintaro Matsuda, Satoru Souda, Akiko Sakai | 2004-06-15 |
| 6705450 | Clean room having an escalator, and method of transporting a semiconductor device therein | — | 2004-03-16 |
| 6595428 | Process control device and process control method using a medium with rewritable marking technique | Hiroshi Mochizuki, Tamio Matsumura | 2003-07-22 |
| 6194907 | Prober and electric evaluation method of semiconductor device | Tsuyoshi Kanao, Toru Yamaguchi | 2001-02-27 |
| 5471084 | Magnetoresistive element and manufacturing method therefor | Yasutoshi Suzuki, Kenichi Ao, Hirofumi Uenoyama, Hiroki Noguchi, Ichiro Ito +1 more | 1995-11-28 |
| 5466638 | Method of manufacturing a metal interconnect with high resistance to electromigration | — | 1995-11-14 |
| 5446301 | Semiconductor device including semiconductor layer having impurity region and method of manufacturing the same | Natsuo Ajika, Kazuyuki Sugahara | 1995-08-29 |
| 5444186 | Multilayer conductive wire for semiconductor device and manufacturing method thereof | — | 1995-08-22 |
| 5381029 | Semiconductor device including semiconductor layer having impurity region and method of manufacturing the same | Natsuo Ajika, Kazuyuki Sugahara | 1995-01-10 |
| 5373192 | Electromigration resistance metal interconnect | — | 1994-12-13 |
| 5200807 | Wiring connection structure for a semiconductor integrated circuit device | — | 1993-04-06 |
| 4859622 | Method of making a trench capacitor for dram | — | 1989-08-22 |
| 4849854 | Semiconductor device and method of manufacturing the same | — | 1989-07-18 |