Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6747466 | Substrate testing apparatus and substrate testing method | Hiromitsu Sugimoto | 2004-06-08 |
| 6194907 | Prober and electric evaluation method of semiconductor device | Koji Eguchi, Toru Yamaguchi | 2001-02-27 |