| 11099138 |
Detection device |
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2021-08-24 |
| 8536861 |
Wire rope flaw detector |
Kimiyasu Furusawa, Taizo Iwami, Takashi Yoshioka |
2013-09-17 |
| 8476898 |
Rope tester detection plate |
Koichiro Nishiyori, Takashi Yoshioka |
2013-07-02 |
| 8390281 |
Wire rope flaw detector for increasing accuracy independent of speed while conserving detector size |
Takashi Yoshioka, Koichiro Nishiyori |
2013-03-05 |
| 8164329 |
Wire rope flaw detector |
Takashi Yoshioka, Yoshinori Miyamoto, Kimiyasu Furusawa, Yukinobu Karata |
2012-04-24 |
| 7982458 |
Wire-rope flaw detector |
Takashi Yoshioka, Yoshinori Miyamoto |
2011-07-19 |
| 6926558 |
Modular jack |
Mutsumi Kinoshita, Mitsutaka Yasuda, Tadashi Fukuda |
2005-08-09 |
| 6690024 |
Laser inspection apparatus |
Koji Funaoka, Masahiko Sakamoto, Shozui Takeno |
2004-02-10 |
| 6215386 |
Coil device |
Katsuhiro Gokita, Mutsumi Kinoshita, Kazuhiko Umeda, Tadashi Fukuda, Toshio Chamura |
2001-04-10 |
| 5590672 |
Semiconductor cleaning apparatus and wafer cassette |
Masashi Ohmori, Hiroshi Tanaka, Akira Nishimoto, Naohiko Fujino, Satoru Kotoh |
1997-01-07 |
| 5568821 |
Semiconductor cleaning apparatus and wafer cassette |
Masashi Ohmori, Hiroshi Tanaka, Akira Nishimoto, Naohiko Fujino, Satoru Kotoh |
1996-10-29 |
| 5551459 |
Semiconductor cleaning apparatus and wafer cassette |
Masashi Ohmori, Hiroshi Tanaka, Akira Nishimoto, Naohiko Fujino, Satoru Kotoh |
1996-09-03 |
| 5445171 |
Semiconductor cleaning apparatus and wafer cassette |
Masashi Ohmori, Hiroshi Tanaka, Akira Nishimoto, Naohiko Fujino, Satoru Kotoh |
1995-08-29 |
