Phillip E. Byrd — 14 Patents at Micron

Phillip E. Byrd has been granted 14 US patents while listed as an inventor at Micron. The first was granted in 2001 and the most recent in May 2007. Phillip E. Byrd ranks #332,869 of 4,157,543 US inventors in our database (top 8.0%). Patent records list Phillip E. Byrd in Boise, ID, US.

Issued Patents All Time

Showing 1–14 of 14 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
7219418	Method to prevent damage to probe card	—	2007-05-22	$2,238,000
7143500	Method to prevent damage to probe card	—	2006-12-05	$3,300,000
7116124	Apparatus to prevent damage to probe card	—	2006-10-03	$1,273,000
6981199	Method for arranging data output by semiconductor testers to packet-based devices under test	—	2005-12-27	$1,583,000
6897672	Apparatus to prevent damage to probe card	—	2005-05-24	$1,184,000
6819161	Structure for temporarily isolating a die from a common conductor to facilitate wafer level testing	Paul Sharratt	2004-11-16	$1,700,000
6819132	Method to prevent damage to probe card	—	2004-11-16	$1,700,000
6809378	Structure for temporarily isolating a die from a common conductor to facilitate wafer level testing	Paul Sharratt	2004-10-26	$1,964,000
6762608	Apparatus and method for testing fuses	Tim Damon	2004-07-13	$2,280,000
6760871	Circuit, system and method for arranging data output by semiconductor testers to packet-based devices under test	—	2004-07-06	$2,228,000
6424161	Apparatus and method for testing fuses	Tim Damon	2002-07-23	$3,822,000
6410352	Apparatus and method for testing fuses	Tim Damon	2002-06-25	$4,927,000
6374376	Circuit, system and method for arranging data output by semiconductor testers to packet-based devices under test	—	2002-04-16	$5,837,000
6181616	Circuits and systems for realigning data output by semiconductor testers to packet-based devices under test	—	2001-01-30	$19,316,000

Phillip E. Byrd — 14 Patents

Issued Patents All Time

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