Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7219418 | Method to prevent damage to probe card | — | 2007-05-22 |
| 7143500 | Method to prevent damage to probe card | — | 2006-12-05 |
| 7116124 | Apparatus to prevent damage to probe card | — | 2006-10-03 |
| 6981199 | Method for arranging data output by semiconductor testers to packet-based devices under test | — | 2005-12-27 |
| 6897672 | Apparatus to prevent damage to probe card | — | 2005-05-24 |
| 6819161 | Structure for temporarily isolating a die from a common conductor to facilitate wafer level testing | Paul Sharratt | 2004-11-16 |
| 6819132 | Method to prevent damage to probe card | — | 2004-11-16 |
| 6809378 | Structure for temporarily isolating a die from a common conductor to facilitate wafer level testing | Paul Sharratt | 2004-10-26 |
| 6762608 | Apparatus and method for testing fuses | Tim Damon | 2004-07-13 |
| 6760871 | Circuit, system and method for arranging data output by semiconductor testers to packet-based devices under test | — | 2004-07-06 |
| 6424161 | Apparatus and method for testing fuses | Tim Damon | 2002-07-23 |
| 6410352 | Apparatus and method for testing fuses | Tim Damon | 2002-06-25 |
| 6374376 | Circuit, system and method for arranging data output by semiconductor testers to packet-based devices under test | — | 2002-04-16 |
| 6181616 | Circuits and systems for realigning data output by semiconductor testers to packet-based devices under test | — | 2001-01-30 |