Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7464308 | CAM expected address search testmode | — | 2008-12-09 |
| 6762608 | Apparatus and method for testing fuses | Phillip E. Byrd | 2004-07-13 |
| 6510533 | Method for detecting or repairing intercell defects in more than one array of a memory device | David D. Siek | 2003-01-21 |
| 6424161 | Apparatus and method for testing fuses | Phillip E. Byrd | 2002-07-23 |
| 6410352 | Apparatus and method for testing fuses | Phillip E. Byrd | 2002-06-25 |
| 6256593 | System for evaluating and reporting semiconductor test processes | Blane Holden, Matt Adsitt, Dan Dean, Mike Pearson | 2001-07-03 |
| 6167541 | Method for detecting or preparing intercell defects in more than one array of a memory device | David D. Siek | 2000-12-26 |
| 6070131 | System for evaluating and reporting semiconductor test processes | Blane Holden, Matt Adsitt, Dan Dean, Mike Pearson | 2000-05-30 |