Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 7464308 | CAM expected address search testmode | — | 2008-12-09 | $1,742,000 |
| 6762608 | Apparatus and method for testing fuses | Phillip E. Byrd | 2004-07-13 | $2,280,000 |
| 6510533 | Method for detecting or repairing intercell defects in more than one array of a memory device | David D. Siek | 2003-01-21 | $3,050,000 |
| 6424161 | Apparatus and method for testing fuses | Phillip E. Byrd | 2002-07-23 | $3,822,000 |
| 6410352 | Apparatus and method for testing fuses | Phillip E. Byrd | 2002-06-25 | $4,927,000 |
| 6256593 | System for evaluating and reporting semiconductor test processes | Blane Holden, Matt Adsitt, Dan Dean, Mike Pearson | 2001-07-03 | $10,281,000 |
| 6167541 | Method for detecting or preparing intercell defects in more than one array of a memory device | David D. Siek | 2000-12-26 | $11,316,000 |
| 6070131 | System for evaluating and reporting semiconductor test processes | Blane Holden, Matt Adsitt, Dan Dean, Mike Pearson | 2000-05-30 | $28,613,000 |